Physical Electronics
nanoTOF TOF-SIMS
  The new PHI TRIFT V nanoTOF surface analysis instrument is the next generation of PHI’s highly successful line of TOF-SIMS instruments which utilize the patented TRIFT analyzer. Several significant improvements have been ... Detaylar
XPS
  Quantera & VersaProbe XPS Microprobe The Quantera , PHI's second generation Scanning X-ray Microprobe provides the sensitivity and tools needed to apply XPS surface analysis to a broader range of current and future product ... Detaylar
Auger Sistemleri
PHI 700 Auger Nanoprobe PHI 700 Scanning Auger Nanoprobe örnek yüzeylerinin, mikron altı özelliklerinin, ince filmlerin ve arayüzlerin elemental ve kimyasal durumlarını veren yüksek performanslı bir Auger Elektron Spektroskopisi ... Detaylar
SIMS
  Long accepted as a tool for depth profiling thin films and insulating materials, Quadrupole Dynamic SIMS ( D-SIMS ) has become the surface analysis method of choice for characterizing ultra shallow implants used in semiconductor ... Detaylar




 
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