Helios 5 Hydra DualBeam
Plasma focused ion beam scanning electron microscopy with multiple ion species for 3D EM and TEM sample preparation.
.png) | The Thermo Scientific Helios 5 Hydra DualBeam (plasma focused ion beam scanning electron microscope, PFIB-SEM) can deliver four different ion species as the primary beam, allowing you to choose the ions that provide the best results for your samples and use cases, such as scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) sample preparation and 3D materials characterization. You can switch easily between argon, nitrogen, oxygen, and xenon in under ten minutes without sacrifcing performance. This unprecedented flexibility significantly expands the potential application space of PFIB and enables research of ion-sample interactions to optimize existing use cases. The Helios 5 Hydra DualBeam combines the new, innovative multi-ion-species plasma FIB (PFIB) column with the monochromated Thermo Scientific Elstar UC+ SEM Column to provide advanced focused ion- and electron-beam performance. Intuitive software and an unprecedented level of automation and ease-of-use allow observation and analysis of relevant subsurface volumes. | |
High-quality sample preparation is critical for successful high-resolution material analysis with STEM or TEM. It is also considered to be one of the most challenging and time-consuming tasks in materials characterization labs. Conventional methods used to prepare ultra-thin samples required for S/TEM are slow and can require many hours, or even days, of effort by highly trained personnel. This is further complicated by the variety of different materials and the need for site-specific information. Plasma FIB, coupled with proprietary and innovative software for automation and ease of use, resolves many of these challenges.
Xenon plasma FIB, for example, is the standard for gallium-free sample preparation, which is vital for sensitive samples such as aluminum-containing materials. The addition of fast switching between all four ion beam species of the Helios 5 Hydra DualBeam goes even further to meet the needs of each of your individual materials, allowing you to find the ideal conditions to prepare the highest quality samples possibl
Large application spaceLargest application space with unique ion source delivering four fast, switchable ion species: Xe, Ar, O, N Advanced automationFastest and easiest, automated, multi-site in situ and ex situ TEM sample preparation and cross-sectioning using optional AutoTEM 5 Software Short time to nanoscaleShortest time to nanoscale information for users with any experience level with SmartAlign and FLASH technologies Electron and ion beam-induced deposition and etchingMost advanced capabilities for electron and ion beam-induced deposition and etching on DualBeam systems with optional Thermo Scientific MultiChem or GIS Gas Delivery Systems. Artifact-free imagingBased on integrated sample cleanliness management and dedicated imaging modes such as SmartScan and DCFI Modes | High throughput and qualityHigh-throughput, high-quality, and statistically relevant 3D characterization, cross sectioning and micromachining using the next-generation 2.5 μA plasma FIB column. High-quality sample preparationHigh-quality gallium-free TEM and APT sample preparation with xenon, argon or oxygen thanks to the new PFIB column enabling 500 V final polishing and delivering superior performance at all operating conditions. Complete sample informationThe most complete sample information with sharp, refined and charge-free contrast obtained from up to six integrated in-column and below-the-lens detectors Precise sample navigationTailored to individual application needs thanks to the high stability and accuracy of the 150 mm Piezo stage or the flexible 110 mm stage and optional in-chamber Thermo Scientific Nav-Cam Camera. | |
For more details: https://www.thermofisher.com/tr/en/home/electron-microscopy/products/dualbeam-fib-sem-microscopes/helios-hydra-dualbeam.html